IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fault analysis method for synchronous sequential circuits

Author(s): Kuo, T.Y. ; Wang, J.F. ; Lee, J.Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Orlando, FL, USA, USA
Conference Date: 24 June 1990
Page(s): 732 - 735
ISBN (Paper): 0-89791-363-9
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1990.114950
Regular:

A new fault analysis method for synchronous sequential circuits is presented. Using the iterative array method, extended forward propagation and backward implication are performed, based on the... View More

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