IEEE - Institute of Electrical and Electronics Engineers, Inc. - A variable observation time method for testing delay faults

Author(s): Mao, W.-W. ; Ciletti, M.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Orlando, FL, USA, USA
Conference Date: 24 June 1990
Page(s): 728 - 731
ISBN (Paper): 0-89791-363-9
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1990.114949
Regular:

Test methodologies for delay faults usually observe output patterns at a single observation time, and the same observation time is used for all faults in the circuit under test. It is shown that... View More

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