IEEE - Institute of Electrical and Electronics Engineers, Inc. - BIST PLAs, pass or fail-a case study

Author(s): Upadhyaya, S.J. ; Thodiyil, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Orlando, FL, USA, USA
Conference Date: 24 June 1990
Page(s): 724 - 727
ISBN (Paper): 0-89791-363-9
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1990.114948
Regular:

Numerous built-in self-testing (BIST) designs exist for the testing of programmable logic arrays (PLA), but their practical usefulness has not been studied. Several BIST designs were implemented... View More

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