IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extension of the critical path tracing algorithm

Author(s): Ramakrishnan, T. ; Kinney, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Orlando, FL, USA, USA
Conference Date: 24 June 1990
Page(s): 720 - 723
ISBN (Paper): 0-89791-363-9
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1990.114947
Regular:

Critical path tracing (CPT) is an approximate algorithm used for fast fault simulation, as part of test generation algorithms. It partitions the circuit to be simulated into fanout free regions in... View More

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