IEEE - Institute of Electrical and Electronics Engineers, Inc. - EST: the new frontier in automatic test-pattern generation

Author(s): Giraldi, J. ; Bushnell, M.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Orlando, FL, USA, USA
Conference Date: 24 June 1990
Page(s): 667 - 672
ISBN (Paper): 0-89791-363-9
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1990.114937
Regular:

An algorithm, called EST, is presented which is a new combinatorial automatic test-pattern generation (ATPG) branch-and-bound search algorithm, based on the generation of equivalent logic... View More

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