IEEE - Institute of Electrical and Electronics Engineers, Inc. - Chinese seal identification

Author(s): Ju-Pei Chou ; Hu-Sheng Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Lexington, KY, USA, USA
Conference Date: 10 October 1990
Page(s): 51 - 53
DOI: 10.1109/CCST.1990.111385
Regular:

The identification of Chinese seal imprints is addressed. In seal identification the foundation rests on two points: one is the characteristic features of the seal and the other is the spatial... View More

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