IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wire and aperture probe modeling in planar near-field scanning

1990 Symposium on Antenna Technology and Applied Electromagnetics

Author(s): Tareef I. Al-Mahdawi ; Tomas J.F. Pavlasek
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1990
Conference Location: Winnipeg, MB, Canada, Canada
Conference Date: 15 August 1990
Page(s): 318 - 323
ISBN (Paper): 978-0-9692563-2-8
Regular:

The use of planar near-field scanning is well developed in characterizing the far-field behavior of directive antennas(1). One of the important steps in predicting the far-field is the... View More

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