IEEE - Institute of Electrical and Electronics Engineers, Inc. - High frequency 6000 V gate GTOs with buried gate structure

Author(s): Ogura, T. ; Nakagawa, A. ; Atsuta, M. ; Kamei, Y. ; Takigami, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Tokyo, Japan
Conference Date: 4 April 1990
Page(s): 252 - 255
ISSN (Paper): 1063-6854
DOI: 10.1109/ISPSD.1990.991092
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