IEEE - Institute of Electrical and Electronics Engineers, Inc. - Focusing of intense ion beam by the “Inverse Pinch Ion Diode”

1990 8th International Conference on High-Power Particle Beams (BEAMS90)

Author(s): Y. Hashimoto ; M. Sato ; M. Yatsuzuka ; S. Nobuhara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1990
Conference Location: Novosibirsk, Russia
Conference Date: 2 July 1990
Page(s): 475 - 480
ISBN (Paper): 9789810205454
Regular:

Focusing of intense ion beams has been attained with the "Inverse Pinch Ion Diode" which has a flat anode. The energy of the ion beam was 180 keV. At the focal point, the ion current density of... View More

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