IEEE - Institute of Electrical and Electronics Engineers, Inc. - Consideration on intensity noise of GaAlAs/GaAs surface emitting laser

Author(s): Koyama, F. ; Morito, K. ; Iga, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Davos, Switzerland, Switzerland
Conference Date: 9 September 1990
Page(s): 116 - 117
DOI: 10.1109/ISLC.1990.764452
Regular:

The relative intensity noise (RIN) of a vertical cavity surface emitting (SE) laser diode was measured to be less than -140 dB/Hz. The RIN was characterized in terms of polarization. Some... View More

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