IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aging tests of amorphous current transformers used in ground current transformers used in ground fault interrupters

Author(s): Nafalski, A. ; Matras, G. ; Wac-Wlodarczyk, A. ; Stryczewska, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Brighton, UK, UK
Conference Date: 17 April 1990
DOI: 10.1109/INTMAG.1990.734512
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