IEEE - Institute of Electrical and Electronics Engineers, Inc. - Large barkhausen effect in 6.5% SiFe single crystalline wires

Author(s): Mohri, K. ; Takamido, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Brighton, UK, UK
Conference Date: 17 April 1990
DOI: 10.1109/INTMAG.1990.734415
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