IEEE - Institute of Electrical and Electronics Engineers, Inc. - A high resolution 3D surface profiling system

Author(s): Srinivasan, V. ; Ong, S.H. ; Lam, C.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Pacific Grove, CA, USA
Conference Date: 27 November 1990
ISBN (Paper): 0-87942-600-4
DOI: 10.1109/IECON.1990.149189
Regular:

An improved version of the structured sine wave illuminated 3D vision system has been developed in order to obtain depth resolution better than 0.05 mm. Errors generated by local imperfections in... View More

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