IEEE - Institute of Electrical and Electronics Engineers, Inc. - Discrete MRF model parameters as features for texture classification

Author(s): Chaur-Chin Chen ; Dubes, R.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 4 November 1990
Page(s): 1 - 6
ISBN (Paper): 0-87942-597-0
DOI: 10.1109/ICSMC.1990.142047
Regular:

Texture classification systems are characterized, existing techniques for texture classification are reviewed, and a method for extracting textural features for classification is proposed. A... View More

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