IEEE - Institute of Electrical and Electronics Engineers, Inc. - Photoemission identification of emitter resistance for CMOS latch-up hysteresis

Author(s): Ming-Jer Chen ; Jeng-Kuo Jeng ; Ping-Nan Tseng ; Nun-Sian Tsai ; Ching-Yuan Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Kyoto, Japan
Conference Date: 18 March 1990
Page(s): 231 - 235
ISBN (Paper): 0-87942-588-1
DOI: 10.1109/ICMTS.1990.161748
Regular:

The authors present a photoemission detection technique applied to a specially designed p-n-p-n structure in order to accurately determine the essential parameters dominating the hysteresis of I-V... View More

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