IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test SRAMs for characterizing alpha particle tracks in CMOS/bulk memories

Author(s): Buehler, M.G. ; Blaes, B.R. ; Soli, G.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Kyoto, Japan
Conference Date: 18 March 1990
Page(s): 113 - 118
ISBN (Paper): 0-87942-588-1
DOI: 10.1109/ICMTS.1990.161723
Regular:

Describes a methodology for using alpha particles to provide an independent measure of the cross section of an upset sensitive region in test SRAMs (static random-access memories). In addition,... View More

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