IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low frequency noise spectroscopy in thin SIMOX MOS transistors

Author(s): Elewa, T. ; Boukriss, B. ; Chovet, A. ; Cristoloveanu, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Key West, FL, USA, USA
Conference Date: 2 October 1990
Page(s): 103 - 104
ISBN (Paper): 0-87942-573-3
DOI: 10.1109/SOSSOI.1990.145730
Regular:

The analysis of the low-frequency noise in SOI MOSFETs is addressed. A simple model is presented which takes into consideration the parallel combination of three sources of noise, associated... View More

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