IEEE - Institute of Electrical and Electronics Engineers, Inc. - Level Of Force Effect On The EMG Power Spectrum: A Reliability Study

Author(s): Bilodeau, M. ; Arsenault, A.B. ; Gravel, D. ; Bourbonnais, D. ; Kemp, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Philadelphia, PA, USA
Conference Date: 1 November 1990
Page(s): 2,196 - 2,197
ISBN (Paper): 0-87942-559-8
DOI: 10.1109/IEMBS.1990.692240
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