IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Thermographic Analysis System At Stress Testing

Author(s): Fujimasa, I. ; Chinzet, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Philadelphia, PA, USA
Conference Date: 1 November 1990
Page(s): 1,582 - 1,583
ISBN (Paper): 0-87942-559-8
DOI: 10.1109/IEMBS.1990.691907
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