IEEE - Institute of Electrical and Electronics Engineers, Inc. - Capturing High Discriminative Fault Features for Electronics-rich Analog System via Deep Learning

Author(s): Zhenbao Liu ; Zhen Jia ; Chi Man Vong ; Shuhui Bu ; Junwei Han ; Xiaojun Tang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2017.2690940
Regular:

Fault detection and isolation (FDI) is very difficult for electronics-rich analog systems due to its sophisticated mechanism and variable operational conditions. Traditionally, FDI in such systems... View More

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