IEEE - Institute of Electrical and Electronics Engineers, Inc. - Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal

Author(s): Serkan Dusmez ; Mehrdad Heydarzadeh ; Mehrdad Nourani ; Bilal Akin
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2017.2665668
Regular:

Reliability of power converters is crucial for mission critical systems. Among the components that are susceptible to failure, power semiconductor devices are one of the major causes of the power... View More

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