IEEE - Institute of Electrical and Electronics Engineers, Inc. - A kernel direct decomposition based monitoring approach for nonlinear quality-related fault detection

Author(s): Guang Wang ; Jianfang Jiao ; Shen Yin
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2633989
Regular:

This article considers the issue of quality-related process monitoring. A novel kernel direct decomposition (KDD) algorithm is proposed and a KDD-based nonlinear qualityrelated fault detection... View More

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