IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced Robustness of State Estimator to Bad Data Processing Through Multi-Innovation Analysis

Author(s): Junbo Zhao ; Gexiang Zhang ; Massimo La Scala ; Zhaoyu Wang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1551-3203
ISSN (Online): 1941-0050
DOI: 10.1109/TII.2016.2626782
Regular:

To enhance the robustness of a power system state estimator to topology errors, bad critical measurements, multiple non-interacting or interacting bad data (BD), this paper presents a new robust... View More

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