IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cross-Layer Optimization for Multilevel Cell STT-RAM Caches

Author(s): Xiuyuan Bi ; Mengjie Mao ; Danghui Wang ; Hai Li
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/TVLSI.2017.2665543
Regular:

Spin-transfer torque random access memory (STT-RAM), as an emerging nonvolatile memory technology, provides very dense array structure and extremely low leakage power consumption. It demonstrates... View More

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