IEEE - Institute of Electrical and Electronics Engineers, Inc. - 28-nm Latch-Type Sense Amplifier Modification for Coupling Suppression

Author(s): Yiping Zhang ; Ziou Wang ; Canyan Zhu ; Lijun Zhang
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 7
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/TVLSI.2017.2649886
Regular:

With the development of modern semiconductor fabrication technology, the channel length of the CMOS device and the device pitch continually shrink accompanied by more and more severe process... View More

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