IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fast and Reliable Cross-Point Three-State/Cell ReRAM

Author(s): Soon-Chan Kwon ; Jong-Min Baek ; Jong-Moon Choi ; Kee-Won Kwon
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/TVLSI.2016.2645384
Regular:

We present a fast and reliable fully integrated cross-point three-state cell resistive random access memory. We accomplish swift back-and-forth hopping among the three resistance states by... View More

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