IEEE - Institute of Electrical and Electronics Engineers, Inc. - ARF-Predictor: Effective Prediction of Aging-Related Failure Using Entropy

Author(s): Pengfei Chen ; Yong Qi ; Xinyi Li ; Di Hou ; Michael Lyu
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1545-5971
DOI: 10.1109/TDSC.2016.2604381
Regular:

Even well-designed software systems suffer from chronic performance degradation, also known as "software aging", due to internal (e.g., software bugs) or external (e.g., resource exhaustion)... View More

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