IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical Attestation in the Smart Grid for Distributed State Verification

Author(s): Thomas Roth ; Bruce McMillin
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1545-5971
DOI: 10.1109/TDSC.2016.2577021
Regular:

A malicious process in a distributed system can fabricate its internal state in its communications with its peers. These state fabrications can cause other processes in the distributed system to... View More

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