IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Combined PLS and Negative Binomial Regression Model for Inferring Association Networks from Next-generation Sequencing Count Data

Author(s): Maiju Pesonen ; Jaakko Nevalainen ; Steven Potter ; Somnath Datta ; Susmita Datta
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1545-5963
DOI: 10.1109/TCBB.2017.2665495
Regular:

A major challenge of genomics data is to detect interactions displaying functional associations from large-scale observations. In this study, a new cPLS-algorithm combining partial least squares... View More

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