IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel adaptive penalized logistic regression for uncovering biomarker associated with anti-cancer drug sensitivity

Author(s): Heewon Park ; Yuichi Shiraishi ; Seiya Imoto ; Satoru Miyano
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1545-5963
DOI: 10.1109/TCBB.2016.2561937
Regular:

We propose a novel adaptive penalized logistic regression modeling strategy based on Wilcoxon rank sum test (WRST) to effectively uncover driver genes in classification. In order to incorporate... View More

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