IEEE - Institute of Electrical and Electronics Engineers, Inc. - Near Field Scan Alignment Procedure for Electrically-Large Apertures

Author(s): Timothy Sleasman ; Mohammadreza F. Imani ; Okan Yurduseven ; Kenneth P. Trofatter ; Vinay Gowda ; Daniel L. Marks ; Jonah L. Gollub ; David R Smith
Sponsor(s): IEEE Antennas and Propagation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 0018-926X
ISSN (Online): 1558-2221
DOI: 10.1109/TAP.2017.2691465
Regular:

Computational imaging at microwave frequencies has gained traction due to its potential for obtaining highquality images with fast acquisition rates. Complex and diverse radiation patterns form... View More

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