IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ultrahigh Storage Densities via the Scaling of Patterned Probe Phase-Change Memories

Author(s): Hasan Hayat ; Krisztian Kohary ; C. David Wright
Sponsor(s): IEEE Nanotechnology Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1536-125X
ISSN (Online): 1941-0085
DOI: 10.1109/TNANO.2017.2690400
Regular:

The scaling potential of patterned probe phase-change memory (PP-PCM) cells is investigated, down to single-nanometer dimensions, using physically realistic simulations that combine... View More

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