IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of Body-Biasing, Supply Voltage and Temperature on the detection of resistive short defects in FDSOI technology.

Author(s): Amit Karel ; Mariane Comte ; Jean-Marc Galliere ; Florence Azais ; Michel Renovell
Sponsor(s): IEEE Nanotechnology Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1536-125X
ISSN (Online): 1941-0085
DOI: 10.1109/TNANO.2017.2664895
Regular:

This paper presents an in-depth analysis of the impact of body-biasing, supply voltage and temperature on the detection of resistive short defects in FDSOI technology. Three types of short defects... View More

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