IEEE - Institute of Electrical and Electronics Engineers, Inc. - Local Large-Margin Multi-Metric Learning for Face and Kinship Verification

Author(s): Junlin Hu ; Jiwen Lu ; Yap-Peng Tan ; Junsong Yuan ; Jie Zhou
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1051-8215
ISSN (Online): 1558-2205
DOI: 10.1109/TCSVT.2017.2691801
Regular:

Metric learning has attracted wide attention in face and kinship verification and a number of such algorithms have been presented over the past few years. However, most existing metric learning... View More

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