IEEE - Institute of Electrical and Electronics Engineers, Inc. - Globally Measuring the Similarity of Superpixels by Binary Edge Maps for Superpixel Clustering

Author(s): Fanman Meng ; Hongliang Li ; Qingbo Wu ; Bing Luo ; Chao Huang ; King Ngan
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Paper): 1051-8215
ISSN (Online): 1558-2205
DOI: 10.1109/TCSVT.2016.2632148
Regular:

This paper proposes an edge based superpixel similarity measurement, which evaluates globally the similarity between superpixels by binary edge map. The basic idea is to assess whether the... View More

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