IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low-Sparsity Unobservable Attacks Against Smart Grid: Attack Exposure Analysis and a Data-Driven Attack Scheme

Author(s): Shengli Xie ; Junjie Yang ; Kan Xie ; Yi Liu ; Zhaoshui He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2169-3536
DOI: 10.1109/ACCESS.2017.2680463
Regular:

Meter data collection and management in smart grid has the potential for underlying security risks, e.g., low-sparsity unobservable attacks. Thus, it is crucial to investigate the vulnerability of... View More

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