IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Bayesian optimal design for accelerated degradation testing based on the Inverse Gaussian process

Author(s): Xiaoyang Li ; Yuqing Hu ; Enrico Zio ; Rui Kang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2169-3536
DOI: 10.1109/ACCESS.2017.2683533
Regular:

Accelerated degradation testing (ADT) is commonly used to obtain degradation data of products by exerting loads over usage conditions. Such data can be used for estimating component lifetime and... View More

Advertisement