IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabric Defect Detection for Apparel Industry: A Nonlocal Sparse Representation Approach

Author(s): Le Tong ; Wai Keung Wong ; Chun Kit Kwong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2169-3536
DOI: 10.1109/ACCESS.2017.2667890
Regular:

With the increasing customer demand on fabric variety in fashion market, fabric texture becomes much more diverse, which brings great challenges to accurate fabric detect detection. In this paper,... View More

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