IEEE - Institute of Electrical and Electronics Engineers, Inc. - Challenges and Solutions in Emerging Memory Testing

Author(s): Elena Ioana Vatajelu ; Paolo Prinetto ; Mottaqiallah Taouil ; Said Hamdioui
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2168-6750
DOI: 10.1109/TETC.2017.2691263
Regular:

The research and prototyping of new memory technologies are getting a lot of attention in order to enable new (computer) architectures and provide new opportunities for today's and future... View More

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