IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Testability and Reliability of Advanced SRAM Architectures

Author(s): Josef Kinseher ; Moritz Volker ; Ilia Polian
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2168-6750
DOI: 10.1109/TETC.2017.2677400
Regular:

As process technology continues to scale, the test quality, yield and reliability of modern System-on-Chips increasingly depend on their embedded SRAM blocks. Their extreme integration density in... View More

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