IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analytical Model for Resistivity and Mean Free Path in On-Chip Interconnects with Rough Surfaces

Author(s): Somesh Kumar ; Rohit Sharma
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2168-6750
DOI: 10.1109/TETC.2016.2597542
Regular:

Planar copper interconnects suffer from surface roughness that results in performance degradation. This paper presents a novel analytical model for calculation effective resistivity and mean free... View More

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