IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness

Author(s): Martin Omana ; Tusharasandeep Edara ; Cecilia Metra
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2168-6750
DOI: 10.1109/TETC.2016.2586380
Regular:

Analyses recently presented in the literature have shown that the Bias Temperature Instability (BTI) ageing phenomenon may increase significantly the susceptibility to soft errors (SEs) of robust... View More

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