IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tunnel FET Current Mode Logic for DPA-Resilient Circuit Designs

Author(s): Yu Bi ; Kaveh Shamsi ; Jiann-Shiun Yuan ; Yier Jin ; Michael Niemier ; X. Sharon Hu
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Online): 2168-6750
DOI: 10.1109/TETC.2016.2559159
Regular:

Emerging devices have been designed and fabricated to extend Moore's Law. While traditional metrics such as power, energy, delay, and area certainly apply to emerging device technologies, new... View More

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