IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dimension Effect on Breakdown Voltage of Partial SOI LDMOS
Author(s): | Yue Hu ; Huazhen Liu ; Qianqian Xu ; Luwen Wang ; Jing Wang ; Shichang Chen ; Peng Zhao ; Ying Wang ; Gaofeng Wang |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Volume: | PP |
Page(s): | 1 |
ISSN (Online): | 2168-6734 |
DOI: | 10.1109/JEDS.2017.2690363 |
Regular:
Dimension effect on breakdown voltage (BV) of lateral double-diffused metal-oxide-semicond