IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Models for Engagement Assessment With Scarce Label Information

Author(s): Feng Li ; Guangfan Zhang ; Wei Wang ; Roger Xu ; Tom Schnell ; Jonathan Wen ; Frederic McKenzie ; Jiang Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 8
ISSN (Paper): 2168-2291
ISSN (Online): 2168-2305
DOI: 10.1109/THMS.2016.2608933
Regular:

Task engagement is defined as loadings on energetic arousal (affect), task motivation, and concentration (cognition) . It is usually challenging and expensive to label cognitive state data, and... View More

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