IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Generic Deep-Learning-Based Approach for Automated Surface Inspection

Author(s): Ruoxu Ren ; Terence Hung ; Kay Chen Tan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Paper): 2168-2267
ISSN (Online): 2168-2275
DOI: 10.1109/TCYB.2017.2668395
Regular:

Automated surface inspection (ASI) is a challenging task in industry, as collecting training dataset is usually costly and related methods are highly dataset-dependent. In this paper, a generic... View More

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