IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Pain: Exploiting Long Short-Term Memory Networks for Facial Expression Classification

Author(s): Pau Rodriguez ; Guillem Cucurull ; Jordi Gonalez ; Josep M. Gonfaus ; Kamal Nasrollahi ; Thomas B. Moeslund ; F. Xavier Roca
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 11
ISSN (Paper): 2168-2267
ISSN (Online): 2168-2275
DOI: 10.1109/TCYB.2017.2662199
Regular:

Pain is an unpleasant feeling that has been shown to be an important factor for the recovery of patients. Since this is costly in human resources and difficult to do objectively, there is the need... View More

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