IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cone Metrics: A New Tool for the Intercomparison of Scatterometer Records

Author(s): Maria Belmonte Rivas ; Ad Stoffelen ; Jeroen Verspeek ; Anton Verhoef ; Xavier Neyt ; Craig Anderson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (Paper): 1939-1404
ISSN (Online): 2151-1535
DOI: 10.1109/JSTARS.2017.2647842
Regular:

With an eye on the generation of a long-term climate record of ocean winds, soil moisture, and sea ice extents across the C-band ERS and ASCAT scatterometer spans, a new calibration tool termed... View More

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