IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Characterization of the Incidence Angle Dependence of Backscatter Using Metop ASCAT

Author(s): Sebastian Hahn ; Christoph Reimer ; Mariette Vreugdenhil ; Thomas Melzer ; Wolfgang Wagner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Paper): 1939-1404
ISSN (Online): 2151-1535
DOI: 10.1109/JSTARS.2016.2628523
Regular:

Observing a target from different look and incidence angles is one of the key features of the Advanced Scatterometer (ASCAT) on-board the series of Metop satellites. The incidence angle dependency... View More

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