IEEE - Institute of Electrical and Electronics Engineers, Inc. - SST Dependence of Ku- and C-Band Backscatter Measurements

Author(s): Zhixiong Wang ; Ad Stoffelen ; Franco Fois ; Anton Verhoef ; Chaofang Zhao ; Mingsen Lin ; Ge Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Paper): 1939-1404
ISSN (Online): 2151-1535
DOI: 10.1109/JSTARS.2016.2600749
Regular:

The normalized radar cross section (NRCS) measured by satellite ocean radar systems is representative of the sea surface roughness at the scale of gravity-capillary waves, which are not only... View More

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